Simultaneous High-resolution Electron and Laser Beam Irradiation for Luminescence Studies in a Scanning Electron


Many scientific studies utilize scanning electron microscopy (SEM), cathodoluminiescence (CL), photoluminescence (PL), and Raman Spectroscopy techniques to characterize newfound materials. This Lehigh University technology combines all of these techniques into one instrument by aligning an electron and laser beam within a high-resolution collection area. To form an image the sample can be scanned in the x and y directions. This setup allows for three modes of operation to offer unique experiments involving irradiation of light and high energy electrons. The instrument can be used for investigating solid-state materials such as LEDs and solar cells, to analyze their light emitting properties.  This technology is protected by a US Patent Application.


Lehigh Tech ID#041212-01



The global microscope market grew by 7% from 2010 to 2011 to about $3 billion; it is expected to grow to $5.4 billion by 2018. [1] While the US microscopy market is considered mature, Asian markets like China, Korea, India, and Taiwan are experiencing steady growth. [2] The developments in nanotechnology, material science and life sciences drive interest in microscopy, in addition to the improvements in software design and increased degrees of automation in end-user industries. Despite high equipment costs and high market consolidation, new tools improving microscopic quality will be in demand, especially as it relates to the study of energy related materials. [3] 


[1] “World Microscopes Markets.” Frost & Sullivan website. (subscription required). (accessed May 16, 2012).

[2] “Analysis of the Microscopes Market: Spending on Life Sciences and Nanotechnoloy Will Lead to Sustained Industry Growth.” Frost & Sullivan website. (subscription required). (accessed May 16, 2012).

[3] “World Microscopes Markets.” Frost & Sullivan website. (subscription required). (accessed May 16, 2012).



Lehigh University is interested in licensing this technology.

App Type Country Serial No. Patent No. File Date Issued Date Expire Date
Provisional [PR] United States 61/705,836 9/26/2012   9/26/2013
For Information, Contact:
Alan Snyder
VP, Research & Grad Programs
Lehigh University
Jonathan Poplawsky
Volkmar Dierolf